The singly scattered radiant intensity is computed analytically without approximation , preserving more of the angular dependence in the radiance than other approximation solutions 單次散射是可以精確求解的,沒有作任何近似,這就使得與其他近似算法相比,該算法包含有更多的角度信息。
Finally , the angular dependence of the top layer fluorescence intensity was investigated when varying the thickness of the top layer . the experimental results are good agreement with the theoretical calculations 實(shí)驗(yàn)結(jié)果和理論計(jì)算符合得很好,這表明掠出射x射線熒光光譜分析技術(shù)完全可以用來分析薄膜厚度等特性。
This demonstrates the feasibility of using grazing emission x - ray fluorescence spectroscopy as a method of studying the thin layer ' s characteristics , such as composition and thickiness etc . with the intimately combining of theoretical , set - up and experimental research , the study on the analysis techniques of grazing emission x - ray fluorescence is developed , and the first set of grazing emission x - ray fluorescence setup is established . at the same time , the angular dependence of the fluorescence intensity with different thickness layer is measured . all the work in this thesis provides the basis for the further researches 本論文采用理論、裝置和實(shí)驗(yàn)研究密切結(jié)合的方式,開展了掠射x射線熒光分析技術(shù)研究工作,在國(guó)內(nèi)建立了首臺(tái)掠出射x射線熒光光譜分析裝置,并對(duì)不同厚度單層和雙層薄膜樣品在掠出射條件下產(chǎn)生的熒光光強(qiáng)與掠射角的對(duì)應(yīng)博士學(xué)位論文:掠射x射線熒光分析技術(shù)研究關(guān)系進(jìn)行了實(shí)驗(yàn)測(cè)定。